scanning electron microscopy practice packet 3 QUESTION #13 14. The backscattered signal differs from the secondary signal in: a. representing mainly the low-energy electrons b. coming from a greater depth in the specimen c. representing information from both the light and dark sides of sample features d. responding to the potential difference between the sample and the detector e. both b. and d. 15. Fields are used in the scanning electron microscope to: a. generate the high voltage b. position the sample at the high potential pole c. stimulate a flow of electrons within the source d. redirect the path of electrons in the gun e. both a. and d. 16. The electron backscatter coefficient varies withbut not with (see diagram) a. atomic number, accelerating voltage b. conductivity, accelerating voltage c. conductivity, melting point d. accelerating voltage, atomic number e. None of the above. It is constant. 4 5 kav 10keV 20 kev 30 keV ●40keV Δ49keV 100 Atomic Number sp ec QUESTION #13 14. The backscattered signal differs from the secondary signal in: a. representing mainly the low-energy electrons b. coming from a greater depth in the specimen c. representing information from both the light and dark sides of sample features d. responding to the potential difference between the sample and the detector e. both b. and d. 15. Fields are used in the scanning electron microscope to: a. generate the high voltage b. position the sample at the high potential pole c. stimulate a flow of electrons within the source d. redirect the path of electrons in the gun e. both a. and d. 16. The electron backscatter coefficient varies withbut not with (see diagram) a. atomic number, accelerating voltage b. conductivity, accelerating voltage c. conductivity, melting point d. accelerating voltage, atomic number e. None of the above. It is constant. 4 5 kav 10keV 20 kev 30 keV ●40keV Δ49keV 100 Atomic Number sp ec